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Other Analytical Services
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Metallographic Cross-sectioning
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Metallographic cross-sectioning is the process of exposing the
internal plane of interest of a sample for detailed examination. The process
consists of mounting, sawing, grinding, polishing, and etching the sample so
it can be analyzed using an optical microscope.
A scanning electron microscope may also be used to
verify and take a closer look at the microstructure that was observed under
an optical microscope.
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Optical Microscopy
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An optical microscope is the most common type of microscope. It is used to view and inspect sample details
that are too small to be viewed with the naked eye. It is easy to use,
and samples can be analyzed in air or water. The images are in natural
color with magnifications of up to 100 to 1000 times. However, it does
not have the same depth of focus and resolving power as the
SEM.
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Particle Impact Noise Detection
(PIND) Testing
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PIND testing is used to detect loose particles inside a device
cavity. This test provides a means of identifying devices that contain
particles with sufficient mass that upon impact with the case, excite the transducer.
It is a non-destructive test.
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Applicable Specifications & Standards:
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Sputtering System
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SIX SIGMA utilizes a sputter-coater system to coat non-metallic
samples with a thin layer of gold (other target materials include carbon, gold-palladium,
platinum, and silver) to make them electrically conductive. This enables them
to be viewed with a scanning electron microscope (SEM).
This conductive coating inhibits charging, reduces thermal damage, and enhances
secondary electron emission when the sample is examined under a
SEM.
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