X-Ray Fluorescence Spectroscopy is used to determine the elemental
composition of materials and the thickness of any lead finish or coating. It
is also used to analyze the elemental concentration of solids and solutions,
and identify specific and trace elements in a material.
XRF is considered to be the best method for verifying RoHS lead-free
compliance. It is non-destructive since only low energy X-rays are used, and
does not have damaging effects on the electronic components or assemblies. It
does not require additional sample preparation (unlike the
SEM), and involves a short analysis time.